The Department Will Be More Reliable
by Andrzej Rucinski
Proposed Microelectronic System Infastructure
The ECE Department is
continuously modifying its curriculum. A flexible senior year and very advanced
plans for introduction of a Computer Engineering degree are just two examples of
recent changes. Thanks to Fairchild Semiconductor and support from the Dean's
Office and the ECE Department, it is becoming feasible to enhance our curriculum
system by incorporating system reliability topics. As much as there is no need
to convince our customers, i.e. industry that our graduates have to be exposed
to reliability issues, it is important to know that the Department is going to
teach reliability in a practical setting. This is because of a donation from
Fairchild allowing us to establish a new reliability laboratory. The new
laboratory will be an integral part of the coherent infrastructure for the
development of microelectronic systems, as shown in the figure above. Two of the
links, the "VLSI & Microsystems" and "Testing" are already implemented. The
combination of the two along with the Microelectronic Reliability Laboratory
will facilitate a complete cycle of the development of microelectronic systems.
The role of the new lab is to verify the reliability of a system and to
introduce failures using accelerated testing. In this way, we will be able to
qualify both structures designed for reliability e.g. fault - tolerant systems,
and those designed to manifest failures e.g. test structures. The cycle should
lead to continuous improvement in design and education using the Total Quality
Management (TQM) philosophy. The presented infrastructure in microelectronic
systems will be not only an integral part of the proposed Computer Engineering
program, but also can be used as a core activity in Collaborative Engineering.
Collaborative Engineering is an interdisciplinary curriculum where students
across the disciplines work together on common projects.
The main purpose of the donated equipment is to create an accelerated
testing (HAST) capability at UNH. The HAST chamber used by Fairchild is shown
below left and similar equipment will be available at UNH this coming fall.
The donated equipment will be used for verification and testing
microelectronic devices (VLSI chips, PCB boards, and microelectronic systems) in
research, education, and service. Over the last couple of years, the ECE
Department has been extensively working with Fairchild Semiconductor. As a
result, the expertise in failure mechanisms such as corrosion in microelectronic
devices has been developed. The same infrastructure, including the equipment in
the Microelectronic Reliability Lab, is planned to be used in research in the
area of non-intrusive, low-maintenance health monitoring in microelectronic
systems.
HAST Testing Chanber